An improved approach for process monitoring in laser material processing

(2016) [Contribution to a book, Contribution to a conference proceedings]

Optical Modelling and Design IV : 5-7 April 2016, Brussels, Belgium / Frank Wyrowski, John T. Sheridan, Youri Meuret (editors) ; sponsored by SPIE
Page(s): 98890T, 6 Seiten

Authors

Authors

König, Hans-Georg
Pütsch, Oliver
Stollenwerk, Jochen Hugo
Loosen, Peter

Identifier