Fusion of micro-metrology techniques for the flexible inspection of MEMS/MOEMS assembly
Bellingham, Wash / SPIE (2008) [Contribution to a conference proceedings]
Optical micro- and nanometrology in microsystems technology II : 8 - 10 April 2008, Strasbourg, France / sponsored by SPIE Europe. Christophe Gorecki ..., ed.
Page(s): 69950I, 12 S.
Schmitt, Robert Heinrich