Cognitive Production Metrology : a new concept for flexibly attending the inspection requirements of small series production

Pfeifer, T.; Schmitt, Robert H.; Pavim, A.; Stemmer, M.; Roloff, M.; Schneider, C.; Doro, M.

London : Springer (2010)
Contribution to a book, Contribution to a conference proceedings

In: Proceedings of the 36th International MATADOR Conference / edited by Srichand Hinduja, Lin Li
Page(s)/Article-Nr.: 359-362

Identifier