Measuring Method for the Interference Contrast of Multi-Beam-Interference

Steger, Michael (Corresponding author); Boes, Simon; Thilker, Sven; Gillner, Arnold

Osaka : JLPS (Japan Laser Processing Society) (2014)
Journal Article

In: Journal of Laser Micro/Nanoengineering
Volume: 9
Issue: 3
Page(s)/Article-Nr.: 225-229