Flexible optical metrology strategies for the control and quality assurance of small series production

Schmitt, Robert H.; Pavim, A.

1. ed.. - Bellingham, Wash : SPIE (2009)
Contribution to a book, Contribution to a conference proceedings

In: Optical measurement systems for industrial inspection VI : 15 - 18 June 2009, Munich, Germany / sponsored by SPIE Europe. Peter H. Lehmann, ed. - Pt. 1-2
Page(s)/Article-Nr.: 738902, 12 S.

Identifier